Auger electron spectrum

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• Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… …   Wikipedia

• Electron — For other uses, see Electron (disambiguation). Electron Experiments with a Crookes tube first demonstrated the particle nature of electrons. In this illustration, the profile of the cross shaped target is projected against the tube face at right… …   Wikipedia

• Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… …   Wikipedia

• AES — agricult. abbr. American Electrochemical Society electr. abbr. Auger Electron Spectrum geo. sc. abbr. Atmospheric Environment Service nucl. abbr. Auger Electron Spectroscopy space sc. abbr. Artificial Earth Satellite telecom. abbr. Atmospheric… …   United dictionary of abbreviations and acronyms

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

• Internal conversion — This article is about the nuclear process. For the chemical process, see Internal conversion (chemistry). Internal conversion is a radioactive decay process where an excited nucleus interacts with an electron in one of the lower atomic orbitals,… …   Wikipedia

• X-ray photoelectron spectroscopy — [ right|thumb|350px|Basic components of a monochromatic XPS system.] X ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state… …   Wikipedia

• X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… …   Wikipedia

• Near edge X-ray absorption fine structure — NEXAFS (Near Edge X ray Absorption Fine Structure) is an element specific electron spectroscopic technique which is highly sensitive to bond angles, bond lengths and the presence of adsorbates. It is widely used in surface science and has also… …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• analysis — /euh nal euh sis/, n., pl. analyses / seez /. 1. the separating of any material or abstract entity into its constituent elements (opposed to synthesis). 2. this process as a method of studying the nature of something or of determining its… …   Universalium